LONG-TERM RESULTS OF SURGICAL REPAIR OF BILE-DUCT INJURIES FOLLOWING LAPAROSCOPIC CHOLECYSTECTOMY

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[唯一标识符]:CDSTIC.ISTP.392914
[文献来源]:科学技术会议录索引(ISTP)
[文献类型]:科技会议
[标题]:LONG-TERM RESULTS OF SURGICAL REPAIR OF BILE-DUCT INJURIES FOLLOWING LAPAROSCOPIC CHOLECYSTECTOMY
[作者]:SR JOHNSON;A KOEHLER;LK PENNINGTON;DW HANTO
[出版单位]:MOSBY, INCST LOUIS
[ISSN_ISBN]:0039-6060
[会议名称]:57th Annual Meeting of the Central-Surgical-Association,CHICAGO, IL,March 2-4, 2000
[来源]:SURGERY,pp 668-675
[主办单位]:Cent Surg Assoc
[地址]:DW HANTO,UNIV_CINCINNATI, COLL MED, DEPT SURG, DIV TRANSPLANTAT, 231 BETHESDA AVE, CINCINNATI, OH 45267 USA
[专业领域]:SURGERY
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[唯一标识符]:CDSITC.AEROSPACE.A79-30478
[文献来源]:美国航空航天数据库(aerospace);国际航宇文摘(IAA)
[资源原始索取号]:A79-30478
[标题]:Temperature distribution in louvered panels
[文摘]:(for spacecraft temperature control)
[出版时间]:197904
[出版年份]:1979
[馆藏索取号]:A79-30478


[唯一标识符]:CDSITC.AEROSPACE.N98-27542
[文献来源]:美国航空航天数据库(aerospace)
[资源原始索取号]:N1998-27542; Reference AN: N98-27542
[标题]:Backside localization of open and shorted IC interconnections
[作者]:Cole E I Jr; Tangyunyong P; Barton D L
[来源]:NASA-no. 19980234609.
[文摘]:A new failure analysis technique has been developed for backside and frontside localization of open and shorted interconnections on ICs. This scanning optical microscopy technique takes advantage of the interactions between IC defects and localized heating using a focused infrared laser lambda = 1,340 nm. Images are produced by monitoring the voltage changes across a constant current supply used to power the IC as the laser beam is scanned across the sample. The method utilizes the Seebeck Effect to localize open interconnections and Thermally-Induced Voltage Alteration (TIVA) to detects shorts. The interaction physics describing the signal generation process and several examples demonstrating the localization of opens and shorts are described. Operational guidelines and limitations are also discussed.
[关键词]:FAILURE ANALYSIS; POSITION LOCATION; ELECTRIC CONTACTS; INTEGRATED CIRCUITS; CONFERENCES ; TEMPERATURE EFFECTS; SEEBECK EFFECT; OPTICAL SCANNERS; MICROSCOPY ; LASER BEAMS; HEATING ; ELECTRIC POTENTIAL; DEFECTS ; ELECTRICAL FAULTS
[出版年份]:1998
[专业领域]:Electronics and Electrical Engineering